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X-Ray Absorption Spectroscopy of Semiconductors

Author: Claudia S. Schnohr

Publisher: Springer

Published: 2014-11-05

Total Pages: 367

ISBN-13: 3662443627

X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

X-Ray Absorption and X-Ray Emission Spectroscopy

Author: Jeroen A. van Bokhoven

Publisher: John Wiley & Sons

Published: 2016-03-21

Total Pages: 940

ISBN-13: 1118844238

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During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X–ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X–ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials

X-ray Scattering From Semiconductors And Other Materials (3rd Edition)

Author: Fewster Paul F

Publisher: World Scientific

Published: 2015-02-12

Total Pages: 512

ISBN-13: 9814436941

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This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

Introduction to XAFS

Author: Grant Bunker

Publisher: Cambridge University Press

Published: 2010-01-28

Total Pages: 269

ISBN-13: 1139485091

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X-ray absorption fine structure spectroscopy (XAFS) is a powerful and versatile technique for studying structures of materials in chemistry, physics, biology and other fields. This textbook is a comprehensive, practical guide to carrying out and interpreting XAFS experiments. Assuming only undergraduate-level physics and mathematics, the textbook is ideally suited for graduate students in physics and chemistry starting XAFS-based research. It contains concise executable example programs in Mathematica 7. Supplementary material available at www.cambridge.org/9780521767750 includes Mathematica code from the book, related Mathematica programs, and worked data analysis examples. The textbook addresses experiment, theory, and data analysis, but is not tied to specific data analysis programs or philosophies. This makes it accessible to a broad audience in the sciences, and a useful guide for researchers entering the subject.

Gamma- and X-ray Spectrometry with Semiconductor Detectors

Author: Klaus Debertin

Publisher: North Holland

Published: 1988

Total Pages: 420

ISBN-13:

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Hardbound. This book covers the topics essential to gamma- and x-ray spectrometry as it is now practiced with semiconductor detectors in the energy range from 5keV to 3MeV. This includes useful physical and mathematical background information, the components of a standard photon spectrometer, spectrum analysis procedures, the energy and efficiency calibration, energy and emission-rate measurement methods and some application examples.

Carrier-driven Disordering in Semiconductors

Author: Patrick Brian Hillyard

Publisher:

Published: 2008

Total Pages: 276

ISBN-13:

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X-Ray Spectroscopy

Author: Shatendra K Sharma

Publisher: BoD – Books on Demand

Published: 2012-02-01

Total Pages: 294

ISBN-13: 9533079673

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The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

X-ray Absorption Fine Structure for Catalysts and Surfaces

Author: Yasuhiro Iwasawa

Publisher: World Scientific

Published: 1996

Total Pages: 438

ISBN-13: 9789810223236

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X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be applied in a static or a dynamic state (in-situ condition). The XAFS can provide information that is not accessible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide a molecular-level approach to the study of reaction mechanisms for the understanding of catalysts and development of new catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The applications of XAFS have now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book caters to a wide range of researchers and students working in the domain or related topics.

Physics of Structurally Disordered Solids

Author: Shashanka Mitra

Publisher: Springer Science & Business Media

Published: 2013-06-29

Total Pages: 788

ISBN-13: 146840850X

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Structurally disordered solids are characterized by their lack of spatial order that is evidenced by the great variety of ordered solids. The former class of materials is commonly termed amorphous or glassy, the latter crystalline. However, both classes share, many of the other physical properties of solids, e. g. , me chanical stability, resistance to shear stress, etc. The traditional macroscopic distinction between the crystalline and the glassy states is that while the former has a fixed melting point, the latter does not. However, with the availability and production of a large number of materials in both crystalline and amorphous states, and their easy inter-convertability, simple de finitions are not possible or at best imprecise. For the present purpose, it is sufficient to say that in contrast to the crystalline state, in which the posi tions of atoms are fixed into adefinite structure, ex cept for small thermal vibrations, the amorphous state of the same material displays varying degrees of de parture from this fixed structure. The amorphous state almost always shows no long range order. Short range order, up to several neighbors, may often be retained, although averaged considerably around their crystalline values. It is generally believed that the amorphous state is a metastable one with respect to the crystal line ordered state, and the conversion to the crystal line state may or may not be easy depending on the na ture of the material, e. g.

Defect-Induced Magnetism in Oxide Semiconductors

Author: Parmod Kumar

Publisher: Elsevier

Published: 2023-05-26

Total Pages: 738

ISBN-13: 0323909086

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Defect-Induced Magnetism in Oxide Semiconductors provides an overview of the latest advances in defect engineering to create new magnetic materials and enable new technological applications. First, the book introduces the mechanisms, behavior, and theory of magnetism in oxide semiconductors and reviews the methods of inducing magnetism in these materials. Then, strategies such as pulsed laser deposition and RF sputtering to grow oxide nanostructured materials with induced magnetism are discussed. This is followed by a review of the most relevant postdeposition methods to induce magnetism in oxide semiconductors including annealing, ion irradiation, and ion implantation. Examples of defect-induced magnetism in oxide semiconductors are provided along with selected applications. This book is a suitable reference for academic researchers and practitioners and for people engaged in research and development in the disciplines of materials science and engineering. Reviews the magnetic, electrical, dielectric and optical properties of oxide semiconductors with defect-induced magnetism Discusses growth and post-deposition strategies to grow oxide nanostructured materials such as oxide thin films with defect-induced magnetism Provides examples of materials with defect-induced magnetism such as zinc oxide, cerium dioxide, hafnium dioxide, and more