Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author: S. Jayanthy
Publisher: Springer
Published: 2018-09-20
Total Pages: 156
ISBN-13: 981132493X
DOWNLOAD EBOOK →This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.