Silicon Nitride, Silicon Dioxide Thin Insulating Films, and Other Emerging Diele[c]trics VIII
Author: Ram Ekwal Sah
Publisher: The Electrochemical Society
Published: 2005
Total Pages: 606
ISBN-13: 9781566774598
DOWNLOAD EBOOK →Author: Ram Ekwal Sah
Publisher: The Electrochemical Society
Published: 2005
Total Pages: 606
ISBN-13: 9781566774598
DOWNLOAD EBOOK →Author: Ram Ekwal Sah
Publisher: The Electrochemical Society
Published: 2007
Total Pages: 863
ISBN-13: 1566775523
DOWNLOAD EBOOK →This issue of ECS Transactions contains the papers presented in the symposium on Silicon Nitride, Silicon Dioxide Thin Insulating Films, and Emerging Dielectics held May 6-11, 2007 in Chicago. Papers were presented on deposition, characterization and applications of the dielectrics including high- and low-k dielectrics, as well as interface states, device characterization, reliabiliy and modeling.
Author: M. Jamal Deen
Publisher: The Electrochemical Society
Published: 1997
Total Pages: 610
ISBN-13: 9781566771375
DOWNLOAD EBOOK →Author: Electrochemical Society. Dielectric Science and Technology Division
Publisher: The Electrochemical Society
Published: 2001
Total Pages: 304
ISBN-13: 9781566773133
DOWNLOAD EBOOK →Author: Electrochemical Society. Meeting
Publisher: The Electrochemical Society
Published: 2003
Total Pages: 652
ISBN-13: 9781566773478
DOWNLOAD EBOOK →Author: R. Ekwal Sah
Publisher: The Electrochemical Society
Published: 2009
Total Pages: 871
ISBN-13: 1566777100
DOWNLOAD EBOOK →The issue of ECS Transactions contains papers presented at the Tenth International Symposium on Silicon Nitride, Silicon Dioxide, and Alternate Emerging Dielectrics held in San Francisco on May 24-29, 2009. The papers address a very wide range of fabrication and characterization techniques, and applications of thin dielectric films in microelectronic and optoelectronic devices. More specific topics addressed by the papers include reliability, interface states, gate oxides, passivation, and dielctric breakdown.
Author: Electrochemical society. Meeting
Publisher: The Electrochemical Society
Published: 2011
Total Pages: 950
ISBN-13: 1566778654
DOWNLOAD EBOOK →This issue of ECS Transactions contains the peer-reviewed full length papers of the International Symposium on Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics held May 1-6, 2011 in Montreal as a part of the 219th Meeting of The Electrochemical Society. The papers address a very diverse range of topics. In addition to the deposition and characterization of the dielectrics, more specific topics addressed by the papers include applications, device characterization and reliability, interface states, interface traps, defects, transistor and gate oxide studies, and modeling.
Author: Vikram J. Kapoor
Publisher: The Electrochemical Society
Published: 1994
Total Pages: 644
ISBN-13: 9781566770484
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