Random Testing of Digital Circuits

Random Testing of Digital Circuits PDF

Author: Rene David

Publisher: CRC Press

Published: 2020-11-26

Total Pages: 508

ISBN-13: 1000146014

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"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

Random Testing of Digital Circuits

Random Testing of Digital Circuits PDF

Author: Rene David

Publisher: CRC Press

Published: 2020-11-25

Total Pages: 496

ISBN-13: 1000110168

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"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits PDF

Author: M. Bushnell

Publisher: Springer Science & Business Media

Published: 2006-04-11

Total Pages: 690

ISBN-13: 0306470403

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Digital Circuit Testing and Testability

Digital Circuit Testing and Testability PDF

Author: Parag K. Lala

Publisher: Academic Press

Published: 1997

Total Pages: 222

ISBN-13: 9780124343306

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An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.

Digital Circuit Testing

Digital Circuit Testing PDF

Author: Francis C. Wong

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 248

ISBN-13: 0080504345

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Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

The Evolution of Fault-Tolerant Computing

The Evolution of Fault-Tolerant Computing PDF

Author: A. Avizienis

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 467

ISBN-13: 3709188717

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For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.