VLSI Design and Test
Author: Anirban Sengupta
Publisher: Springer
Published: 2019-08-17
Total Pages: 775
ISBN-13: 9813297670
DOWNLOAD EBOOK →This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.