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Procedures in Scanning Probe Microscopies

Author: Richard J. Colton

Publisher:

Published: 1998-08-21

Total Pages: 682

ISBN-13:

Procedures in Scanning Probe Microscopies Edited by R J Colton, Naval Research Laboratory, Washington DC, USA A Engel, Biocenter, Basel University, Switzerland J Frommer, IBM Almaden Research Center, San Jose, CA, USA H E Gaub, Technical University, Munich, Germany A A Gewirth, University of Illinois, Urbana, IL, USA R Guckenberger, Max-Planck-Institute for Biochemistry, Martinsried, Germany W Heckl, Ludwig Maximillians University, Munich, Germany B Parkinson, Colorado State University, Fort Collins, CO, USA J Rabe, Humboldt University, Berlin, Germany Scanning Probe Microscopies (SPM) are revolutionising scientific discovery in diverse disciplines including organic, inorganic and physical chemistry, polymer and materials science, biological and medical systems, electrochemistry and nanotechnology. In this collection of protocols, Procedures in Scanning Probe Microscopies will enable you to: * Build confidence in using SPM * Maximise the potential of your SPM instrumentation * Extend your skill levels The only applications-orientated guide, Procedures in Scanning Probe Microscopies covers scanning tunnelling microscopy, atomic force microscopy and electrochemical methods.

Scanning Probe Microscopy

Author: Ernst Meyer

Publisher: Springer Science & Business Media

Published: 2013-03-14

Total Pages: 215

ISBN-13: 3662098016

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Procedures in Scanning Probe Microscopies

Author: Frommer's Staff

Publisher:

Published: 1995-06-01

Total Pages: 400

ISBN-13: 9780471942979

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Scanning Probe Microscopes

Author: K. S. Birdi

Publisher: CRC Press

Published: 2003-02-26

Total Pages: 450

ISBN-13: 1135516332

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Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an

Applied Scanning Probe Methods II

Author: Bharat Bhushan

Publisher: Springer Science & Business Media

Published: 2006-06-22

Total Pages: 456

ISBN-13: 3540274537

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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Design, Modeling and Control of Nanopositioning Systems

Author: Andrew J. Fleming

Publisher: Springer

Published: 2014-05-15

Total Pages: 418

ISBN-13: 331906617X

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Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text on the topic. The book first introduces concepts associated with nanopositioning stages and outlines their application in such tasks as scanning probe microscopy, nanofabrication, data storage, cell surgery and precision optics. Piezoelectric transducers, employed ubiquitously in nanopositioning applications are then discussed in detail including practical considerations and constraints on transducer response. The reader is then given an overview of the types of nanopositioner before the text turns to the in-depth coverage of mechanical design including flexures, materials, manufacturing techniques, and electronics. This process is illustrated by the example of a high-speed serial-kinematic nanopositioner. Position sensors are then catalogued and described and the text then focuses on control. Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging. Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading.

Scanning Probe Microscopy and Spectroscopy

Author: Roland Wiesendanger

Publisher: Cambridge University Press

Published: 1994-09-29

Total Pages: 664

ISBN-13: 9780521428477

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The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.

Bringing Scanning Probe Microscopy up to Speed

Author: Stephen C. Minne

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 169

ISBN-13: 1461551676

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Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.

Scanning Probe Microscopy

Author: Sergei V. Kalinin

Publisher: Springer Science & Business Media

Published: 2007-04-03

Total Pages: 1002

ISBN-13: 0387286683

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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Roadmap of Scanning Probe Microscopy

Author: Seizo Morita

Publisher: Springer Science & Business Media

Published: 2006-12-30

Total Pages: 207

ISBN-13: 3540343156

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Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.