Principles of Semiconductor Network Testing

Principles of Semiconductor Network Testing PDF

Author: Amir Afshar

Publisher: Elsevier

Published: 1996-04-22

Total Pages: 350

ISBN-13: 9780080539560

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Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers Best new source of information for experienced semiconductor engineers as well as entry-level personnel Eight chapters about semiconductor testing

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits PDF

Author: M. Bushnell

Publisher: Springer Science & Business Media

Published: 2004-12-15

Total Pages: 712

ISBN-13: 0792379918

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

CE Marking Handbook

CE Marking Handbook PDF

Author: Dave Lohbeck

Publisher: Elsevier

Published: 1998-09-30

Total Pages: 144

ISBN-13: 9780080500829

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This book is essential reading for electronic consumer-product manufacturers doing business in the European marketplace. Compliance with directives and procedures can be a complex and confusing process, resulting in wasted money and effort. With the help of the CE Marking Handbook, engineers and managers can more easily identify which rules apply to them and pinpoint what they need to do to comply. Dave Lohbeck was formerly the Manager for Seminars and Training at TUV Rhineland, the largest German testing and certification agency. He has worked for many years as an engineer, including nine years in the field of European safety and EMC compliance. A once complicated topic is made clear as the author addresses the confusion surrounding CE Marking. Lohbeck offers guidance on both legal and design issues. This book includes a step-by-step design guide aimed at both novice and experienced exporters. With its help, engineers and managers can easily identify which rules apply to their products and pinpoint what they need to do to comply. The information presented here is backed up with facts and examples. Many have been misled, unfortunately, but this book presents the real meaning of CE Marking. Shows design engineers how to comply with CE requirements for product conformity Explains legal and technical issues concisely and logically Presents and illuminates US and EU differences

Satellite Communication Engineering

Satellite Communication Engineering PDF

Author: Michael Olorunfunmi Kolawole

Publisher: CRC Press

Published: 2017-07-12

Total Pages: 288

ISBN-13: 1482210118

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An undeniably rich and thorough guide to satellite communication engineering, Satellite Communication Engineering, Second Edition presents the fundamentals of information communications systems in a simple and succinct way. This book considers both the engineering aspects of satellite systems as well as the practical issues in the broad field of information transmission. Implementing concepts developed on an intuitive, physical basis and utilizing a combination of applications and performance curves, this book starts off with a progressive foundation in satellite technology, and then moves on to more complex concepts with ease. What’s New in the Second Edition: The second edition covers satellite and Earth station design; global positioning systems; antenna tracking; links and communications systems; error detection and correction; data security; regulations and procedures for system modeling; integration; testing; and reliability and performance evaluation. Provides readers with the systems building blocks of satellite transponders and Earth stations, as well as the systems engineering design procedure Includes the tools needed to calculate basic orbit characteristics such as period, dwell time, coverage area, propagation losses; antenna system features such as size, beamwidth, aperture-frequency product, gain, tracking control; and system requirements such as power, availability, reliability, and performance Presents problem sets and starred sections containing basic mathematical development Details recent developments enabling digital information transmission and delivery via satellite Satellite Communication Engineering, Second Edition serves as a textbook for students and a resource for space agencies and relevant industries.

Principles of Testing Electronic Systems

Principles of Testing Electronic Systems PDF

Author: Samiha Mourad

Publisher: John Wiley & Sons

Published: 2000-07-25

Total Pages: 444

ISBN-13: 9780471319313

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A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures PDF

Author: Laung-Terng Wang

Publisher: Elsevier

Published: 2006-08-14

Total Pages: 808

ISBN-13: 9780080474793

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

High-Speed Digital System Design

High-Speed Digital System Design PDF

Author: Anatoly Belous

Publisher: Springer Nature

Published: 2019-11-13

Total Pages: 933

ISBN-13: 3030254097

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This book describes for readers the entire, interconnected complex of theoretical and practical aspects of designing and organizing the production of various electronic devices, the general and main distinguishing feature of which is the high speed of processing and transmitting of digital signals. The authors discuss all the main stages of design - from the upper system level of the hierarchy (telecommunications system, 5G mobile communications) to the lower level of basic semiconductor elements, printed circuit boards. Since the developers of these devices in practice deal with distorted digital signals that are transmitted against a background of interference, the authors not only explain the physical nature of such effects, but also offer specific solutions as to how to avoid such parasitic effects, even at the design stage of high-speed devices.

System-on-Chip Test Architectures

System-on-Chip Test Architectures PDF

Author: Laung-Terng Wang

Publisher:

Published: 2010

Total Pages: 896

ISBN-13:

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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. KEY FEATURES * Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. * Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. * Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. * Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. * Practical problems at the end of each chapter for students.

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