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Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices
Author: O. J. Glembocki
Publisher: SPIE-International Society for Optical Engineering
Published: 1987
Total Pages: 296
ISBN-13:
DOWNLOAD EBOOK →Bibliographic Guide to Conference Publications
Author: New York Public Library. Research Libraries
Publisher:
Published: 1987
Total Pages: 708
ISBN-13:
DOWNLOAD EBOOK →Vols. for 1975- include publications cataloged by the Research Libraries of the New York Public Library with additional entries from the Library of Congress MARC tapes.
Index of Conference Proceedings Received
Author: British Library. Lending Division
Publisher:
Published: 1988
Total Pages: 492
ISBN-13:
DOWNLOAD EBOOK →Optical Characterization Techniques for High-performance Microelectronic Device Manufacturing II
Author: John Lowell
Publisher: Society of Photo Optical
Published: 1995
Total Pages: 302
ISBN-13: 9780819420046
DOWNLOAD EBOOK →INIS Atomindeks
Optical Characterization Techniques for High-performance Microelectronic Device Manufacturing II
Spectroscopic Characterization Techniques for Semiconductor Technology V
Author: O. J. Glembocki
Publisher: Society of Photo Optical
Published: 1994-01-01
Total Pages: 220
ISBN-13: 9780819414366
DOWNLOAD EBOOK →Spectroscopic Characterization Techniques for Semiconductor Technology V
A Century of Innovation
Author: 3M Company
Publisher: 3m Company
Published: 2002
Total Pages: 246
ISBN-13:
DOWNLOAD EBOOK →A compilation of 3M voices, memories, facts and experiences from the company's first 100 years.
