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Microscopy Methods in Nanomaterials Characterization

Author: Sabu Thomas

Publisher: Elsevier

Published: 2017-05-17

Total Pages: 432

ISBN-13: 0323461476

Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each

Nanocharacterization Techniques

Author: Osvaldo de Oliveira, Jr

Publisher: William Andrew

Published: 2017-03-18

Total Pages: 222

ISBN-13: 0323497799

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Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered Serves as an important, go-to reference for materials scientists and engineers

Scanning Microscopy for Nanotechnology

Author: Weilie Zhou

Publisher: Springer Science & Business Media

Published: 2007-03-09

Total Pages: 533

ISBN-13: 0387396209

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Transmission Electron Microscopy Characterization of Nanomaterials

Author: Challa S.S.R. Kumar

Publisher: Springer Science & Business Media

Published: 2013-12-09

Total Pages: 717

ISBN-13: 3642389341

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Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Spectroscopic Methods for Nanomaterials Characterization

Author: Sabu Thomas

Publisher: Elsevier

Published: 2017-05-19

Total Pages: 444

ISBN-13: 0323461468

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Nanomaterials Characterization Techniques, Volume Two, part of an ongoing series, offers a detailed analysis of the different types of spectroscopic methods currently being used in nanocharacterization. These include, for example, the Raman spectroscopic method for the characterization of carbon nanotubes (CNTs). This book outlines the different kinds of spectroscopic tools being used for the characterization of nanomaterials and discusses under what conditions each should be used. The book is intended to cover all the major spectroscopic techniques for nanocharacterization, making it an important resource for both the academic community at the research level and the industrial community involved in nanomanufacturing. Explores how spectroscopy and X-ray-based nanocharacterization techniques are applied in modern industry Analyzes all the major spectroscopy and X-ray-based nanocharacterization techniques, allowing the reader to choose the best for their situation Presents a method-orientated approach that explains how to successfully use each technique

In-situ Characterization Techniques for Nanomaterials

Author: Challa S.S.R. Kumar

Publisher: Springer

Published: 2018-04-17

Total Pages: 452

ISBN-13: 3662563223

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Seventh volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about In-situ Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Magnetic Characterization Techniques for Nanomaterials

Author: Challa S.S.R. Kumar

Publisher: Springer

Published: 2017-04-24

Total Pages: 566

ISBN-13: 3662527804

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Sixth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Magnetic Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

The Transmission Electron Microscope

Author: Khan Maaz

Publisher: BoD – Books on Demand

Published: 2015-09-02

Total Pages: 362

ISBN-13: 9535121502

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This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.

Materials Characterization

Author: Yang Leng

Publisher: John Wiley & Sons

Published: 2009-03-04

Total Pages: 384

ISBN-13: 0470822996

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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Handbook of Materials Characterization

Author: Surender Kumar Sharma

Publisher: Springer

Published: 2018-09-18

Total Pages: 613

ISBN-13: 3319929550

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This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.