Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III
Author: Hans-Dieter Hartmann
Publisher: SPIE-International Society for Optical Engineering
Published: 1997
Total Pages: 0
ISBN-13: 9780819426482
DOWNLOAD EBOOK →Author: Hans-Dieter Hartmann
Publisher: SPIE-International Society for Optical Engineering
Published: 1997
Total Pages: 0
ISBN-13: 9780819426482
DOWNLOAD EBOOK →Author: Ali Keshavarzi
Publisher: SPIE-International Society for Optical Engineering
Published: 1996-01-01
Total Pages: 372
ISBN-13: 9780819422729
DOWNLOAD EBOOK →Author: Gopal K. Rao
Publisher: Society of Photo Optical
Published: 1995
Total Pages: 284
ISBN-13: 9780819420015
DOWNLOAD EBOOK →Author: Sharad Prasad
Publisher: Society of Photo Optical
Published: 1998
Total Pages: 240
ISBN-13: 9780819429698
DOWNLOAD EBOOK →A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.
Author: A. Christou
Publisher: RIAC
Published: 2006
Total Pages: 410
ISBN-13: 1933904151
DOWNLOAD EBOOK →Author: Way Kuo
Publisher: Springer Science & Business Media
Published: 2013-11-27
Total Pages: 407
ISBN-13: 1461556716
DOWNLOAD EBOOK →The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.
Author: Gudrun Kissinger
Publisher: Society of Photo Optical
Published: 2001
Total Pages: 242
ISBN-13: 9780819441072
DOWNLOAD EBOOK →Author: European Optical Society
Publisher: Society of Photo Optical
Published: 1999
Total Pages: 344
ISBN-13: 9780819432230
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