Microelectronics Fialure Analysis Desk Reference, Seventh Edition

Microelectronics Fialure Analysis Desk Reference, Seventh Edition PDF

Author: Tejinder Gandhi

Publisher: ASM International

Published: 2019-11-01

Total Pages: 750

ISBN-13: 1627082468

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The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.

Microelectronic Failure Analysis

Microelectronic Failure Analysis PDF

Author:

Publisher: ASM International

Published: 2002-01-01

Total Pages: 160

ISBN-13: 0871707691

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Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee

Microelectronic Failure Analysis

Microelectronic Failure Analysis PDF

Author: Thomas W. Lee

Publisher: Asm International

Published: 1993

Total Pages: 404

ISBN-13: 9780871704795

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A compact compendium of information and techniques designed to address many of the varied subjects of concern to failure analysis. The volume is divided into sections devoted to failure analysis procedures and overview, electrical and mechanical characterization, specimen preparation, metallurgical

Microelectronic Failure Analysis

Microelectronic Failure Analysis PDF

Author: Richard J. Ross

Publisher: ASM International(OH)

Published: 1999

Total Pages: 664

ISBN-13:

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Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth ed

Microelectronics Failure Analysis

Microelectronics Failure Analysis PDF

Author:

Publisher: ASM International

Published: 2004-01-01

Total Pages: 813

ISBN-13: 0871708043

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For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron

Istfa 2003

Istfa 2003 PDF

Author: ASM International

Publisher: ASM International

Published: 2003-01-01

Total Pages: 534

ISBN-13: 1615030867

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Istfa 2001

Istfa 2001 PDF

Author: ASM International

Publisher: ASM International

Published: 2001-01-01

Total Pages: 456

ISBN-13: 1615030859

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Introduction to Focused Ion Beams

Introduction to Focused Ion Beams PDF

Author: Lucille A. Giannuzzi

Publisher: Springer Science & Business Media

Published: 2006-05-18

Total Pages: 362

ISBN-13: 038723313X

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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.