Istfa 2005
Author: ASM International
Publisher: ASM International
Published: 2005-01-01
Total Pages: 524
ISBN-13: 1615030883
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ISTFA 2006
Author: Electronic Device Failure Analysis Society
Publisher: ASM International
Published: 2006
Total Pages: 524
ISBN-13: 1615030891
DOWNLOAD EBOOK →ISTFA 2010
Author:
Publisher: ASM International
Published: 2010-01-01
Total Pages: 487
ISBN-13: 1615037276
DOWNLOAD EBOOK →Thirty-fourth International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
Published: 2008-01-01
Total Pages: 551
ISBN-13: 1615030913
DOWNLOAD EBOOK →ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
Published: 2007-01-01
Total Pages: 372
ISBN-13: 1615030905
DOWNLOAD EBOOK →Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2012
Author: ASM International
Publisher: ASM International
Published: 2012
Total Pages: 643
ISBN-13: 1615039953
DOWNLOAD EBOOK →ISTFA 2005
Author: ASM International
Publisher: ASM International(OH)
Published: 2005
Total Pages: 523
ISBN-13: 9780871708236
DOWNLOAD EBOOK →ISTFA 2013
Author: A. S. M. International
Publisher: ASM International
Published: 2013-01-01
Total Pages: 634
ISBN-13: 1627080228
DOWNLOAD EBOOK →This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
ISTFA 2011
Author:
Publisher: ASM International
Published: 2011
Total Pages: 479
ISBN-13: 1615038507
DOWNLOAD EBOOK →ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Author:
Publisher: ASM International
Published: 2018-12-01
Total Pages:
ISBN-13: 1627080996
DOWNLOAD EBOOK →The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
