Istfa 2003
Author: ASM International
Publisher: ASM International
Published: 2003-01-01
Total Pages: 534
ISBN-13: 1615030867
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Istfa 2005
Author: ASM International
Publisher: ASM International
Published: 2005-01-01
Total Pages: 524
ISBN-13: 1615030883
DOWNLOAD EBOOK →ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
Published: 2007-01-01
Total Pages: 372
ISBN-13: 1615030905
DOWNLOAD EBOOK →Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2006
Author: Electronic Device Failure Analysis Society
Publisher: ASM International
Published: 2006
Total Pages: 524
ISBN-13: 1615030891
DOWNLOAD EBOOK →ISTFA 2013
Author: A. S. M. International
Publisher: ASM International
Published: 2013-01-01
Total Pages: 634
ISBN-13: 1627080228
DOWNLOAD EBOOK →This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
ISTFA 2014
Author: A. S. M. International
Publisher: ASM International
Published: 2014-11-01
Total Pages: 561
ISBN-13: 1627080740
DOWNLOAD EBOOK →This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
ISTFA 2011
Author:
Publisher: ASM International
Published: 2011
Total Pages: 479
ISBN-13: 1615038507
DOWNLOAD EBOOK →ISTFA 2012
Author: ASM International
Publisher: ASM International
Published: 2012
Total Pages: 643
ISBN-13: 1615039953
DOWNLOAD EBOOK →ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Author:
Publisher: ASM International
Published: 2017-12-01
Total Pages:
ISBN-13: 1627081518
DOWNLOAD EBOOK →The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
ISTFA 2010
Author:
Publisher: ASM International
Published: 2010-01-01
Total Pages: 487
ISBN-13: 1615037276
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