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Interferometry in Speckle Light

Author: P. Jacquot

Publisher: Springer Science & Business Media

Published: 2012-02-02

Total Pages: 661

ISBN-13: 3642573231

These proceedings reflect the work presented at the conference "Interferometry in Speckle Light: Theory and Applications", held at the Ecole Polytechnique Federale de Lausanne, (EPFL), the Swiss Federal Institute of Technology in Lausanne, Switzerland. The event took place from September 25 to September 28, 2000. Thanks to the diligence of the authors, this book has been published just in time for the conference. Writing this preface in July, in anticipation of the conference, we have tried to envisage how this book will benefit the quality of discourse between authors and attendees. "Interferometry in Speckle Light: Theory and Applications" results from a bottom-up approach and is original in several ways. This conference is not part of a series; on the contrary, it is a single event. The idea of gathering scientists and engineers for a general discussion on the theory and the practice of interferometry, involving rough, non-optically polished objects, was "in the air". An opportunity of this sort was not provided by any of the conferences scheduled when the present one was conceived. For this reason, it was easy to convince a small number of renowned researchers, all of them active in the field of holographic and speckle interferometry, to organize a conference. To be specific, they are the people listed below as members of the scientific and local committees. At the same time, a particular circumstance, namely the retirement of Professor L. Pflug, helped to detennine the location of the meeting.

Holographic and Speckle Interferometry

Author: Robert Jones

Publisher: Cambridge University Press

Published: 1989-01-26

Total Pages: 372

ISBN-13: 9780521348782

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Holographic and speckle interferometry are optical techniques which use lasers to make non-contracting field view measurements at a sensitivity of the wavelength of light on optically rough (i.e. non-mirrored) surfaces. They may be used to measure static or dynamic displacements, the shape of objects, and refractive index variations of transparent media. As such, these techniques have been applied to the solution of a wide range of problems in strain and vibrational analysis, non-destructive testing (NDT), component inspection and design analysis and fluid flow visualisation. This book provides a self-contained, unified, theoretical analysis of the basic principles and associated opto-electronic techniques (for example Electronic Speckle Pattern Interferometry). In addition, a detailed discussion of experimental design and practical application to the solution of physical problems is presented. In this new edition, the authors have taken the opportunity to include a much more coherent description of more than twenty individual case studies that are representative of the main uses to which the techniques are put. The Bibliography has also been brought up to date.

Laser Speckle and Related Phenomena

Author: J.C. Dainty

Publisher: Springer Science & Business Media

Published: 2013-12-18

Total Pages: 295

ISBN-13: 3662432056

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With contributions by numerous experts

Basics of Interferometry

Author: P. Hariharan

Publisher: Academic Press

Published: 2012-12-02

Total Pages: 232

ISBN-13: 0080918611

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This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers. The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.

Laser Speckle and Applications in Optics

Author: M Francon

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 174

ISBN-13: 0323160727

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Laser Speckle and Applications in Optics focuses on developments in laser speckle techniques, with emphasis on the experimental aspect of phenomena and on applications in optics. These applications include interference with scattered light, optical processing of images, and studies of surface roughness as well as displacements and deformations of diffuse objects. This book is comprised of 10 chapters and begins by reviewing the elements of diffraction theory and the properties of speckle in the image of a diffuse object. The discussion then turns to speckle in the near field and interferometry with diffuse light, along with experiments in which interference patterns are produced from photographically superimposed laterally shifted speckle patterns. The following chapters consider optical processing of images modulated by speckle; deformations and displacements of diffuse objects; speckle applications in astronomy; and surface roughness measurements. The final chapter looks at the use of laser speckle to study transparent objects; the average shape of diffuse surfaces; the transfer functions and aberrations of optical systems; and the movement of diffuse objects. This monograph will be of value to physicists and researchers as well as those interested in lasers and optics.

Speckle Metrology

Author: R Erf

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 346

ISBN-13: 0323154972

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Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications. The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system geometries, data reduction procedures, and specific applications. These applications are discussed in detail in individual chapters, such as structures inspection. Adaptation of speckle measurement techniques in video recording and processing technology is also given emphasis in one chapter. Finally, one chapter is dedicated to a discussion on the speckle interferometer as one of the most used instrument in metrological speckle application. This text is a valuable reference to students in the fields of engineering and applied science.

Speckle Metrology

Author: R.S. Sirohi

Publisher: CRC Press

Published: 2020-08-18

Total Pages: 572

ISBN-13: 1000104958

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This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

Optical Interferometry, 2e

Author: P. Hariharan

Publisher: Elsevier

Published: 2003-10-20

Total Pages: 368

ISBN-13: 0080473644

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When the first edition of Optical Interferometry was published, interferometry was regarded as a rather esoteric method of making measurements, largely confined to the laboratory. Today, however, besides its use in several fields of research, it has applications in fields as diverse as measurement of length and velocity, sensors for rotation, acceleration, vibration and electrical and magnetic fields, as well as in microscopy and nanotechnology. Most topics are discussed first at a level accessible to anyone with a basic knowledge of physical optics, then a more detailed treatment of the topic is undertaken, and finally each topic is supplemented by a reference list of more than 1000 selected original publications in total. Historical development of interferometry The laser as a light source Two-beam interference Techniques for frequency stabilization Coherence Electronic phase measurements Multiple-beam interference Quantum effects in optical interference Extensive coverage of the applications of interferometry, such as measurements of length, optical testing, interference microscopy, interference spectroscopy, Fourier-transform spectroscopy, interferometric sensors, nonlinear interferometers, stellar interferometry, and studies of space-time and gravitation

Optical Interferometry, 2e

Author: P. Hariharan

Publisher: Academic Press

Published: 2003-09-22

Total Pages: 369

ISBN-13: 0123116309

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Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.

Interferometry

Author: W. H. Steel

Publisher: Cambridge University Press

Published: 1985-12-27

Total Pages: 328

ISBN-13: 9780521311625

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Enlarged and updated in 1983, this is the second edition of Dr Steel's popular textbook on interferometry. The text has been revised throughout and major additions have been made to reflect the phenomenal growth of laser techniques and applications. The book provides a general treatment that brings together the many different applications of the interference of light waves, light being used in its most general sense to include all electromagnetic radiation. The applications can cover precise measurement of length, the testing of optical components against a computed hologram, measurements of atmospheric pollution by infrared spectroscopy and many of the methods of radio astronomy and the measurement of size of visible stars. These apparently unrelated methods have a common theory, which the book presents and extends to each main field of application. It shows workers in one field how their problems relate to those in other fields, where they may have been solved already. The book will be found useful by anyone whose work involves one of the many applications of interferometric techniques.