Integrated Circuit Test Engineering

Integrated Circuit Test Engineering PDF

Author: Ian A. Grout

Publisher: Springer Science & Business Media

Published: 2005-08-22

Total Pages: 396

ISBN-13: 9781846280238

DOWNLOAD EBOOK →

Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

Integrated Circuit Design, Fabrication, and Test

Integrated Circuit Design, Fabrication, and Test PDF

Author: Peter Shepherd

Publisher: McGraw-Hill Professional Publishing

Published: 1996

Total Pages: 248

ISBN-13:

DOWNLOAD EBOOK →

All aspects of chip realization for both digital and analog circuits are covered. Electronics engineers are shown how to choose appropriate technololgy and circuit architecture, and plan the IC design. They'll gain expert information on power consaiderations, the advantages and disadvantages of each IC architecture, and aspects of design for testability.

Advances in Electronic Testing

Advances in Electronic Testing PDF

Author: Dimitris Gizopoulos

Publisher: Springer Science & Business Media

Published: 2006-01-22

Total Pages: 431

ISBN-13: 0387294090

DOWNLOAD EBOOK →

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Integrated Circuit Quality and Reliability

Integrated Circuit Quality and Reliability PDF

Author: Eugene R. Hnatek

Publisher:

Published: 1987

Total Pages: 736

ISBN-13:

DOWNLOAD EBOOK →

Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

An Introduction to Mixed-signal IC Test and Measurement

An Introduction to Mixed-signal IC Test and Measurement PDF

Author: Gordon W. Roberts

Publisher:

Published: 2012

Total Pages: 0

ISBN-13: 9780199796212

DOWNLOAD EBOOK →

With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topicswill help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples,exercises and problems.

Fault Diagnosis of Analog Integrated Circuits

Fault Diagnosis of Analog Integrated Circuits PDF

Author: Prithviraj Kabisatpathy

Publisher: Springer Science & Business Media

Published: 2006-01-13

Total Pages: 183

ISBN-13: 0387257438

DOWNLOAD EBOOK →

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Radio-Frequency Integrated-Circuit Engineering

Radio-Frequency Integrated-Circuit Engineering PDF

Author: Cam Nguyen

Publisher: John Wiley & Sons

Published: 2015-03-03

Total Pages: 888

ISBN-13: 1118936485

DOWNLOAD EBOOK →

Radio-Frequency Integrated-Circuit Engineering addressesthe theory, analysis and design of passive and active RFIC's usingSi-based CMOS and Bi-CMOS technologies, and other non-silicon basedtechnologies. The materials covered are self-contained andpresented in such detail that allows readers with onlyundergraduate electrical engineering knowledge in EM, RF, andcircuits to understand and design RFICs. Organized into sixteenchapters, blending analog and microwave engineering,Radio-Frequency Integrated-Circuit Engineering emphasizesthe microwave engineering approach for RFICs. • Provides essential knowledge in EM and microwaveengineering, passive and active RFICs, RFIC analysis and designtechniques, and RF systems vital for RFIC students andengineers • Blends analog and microwave engineering approaches forRFIC design at high frequencies • Includes problems at the end of each chapter

In–Circuit Testing

In–Circuit Testing PDF

Author: Allen Buckroyd

Publisher: Butterworth-Heinemann

Published: 2015-07-14

Total Pages: 183

ISBN-13: 1483144496

DOWNLOAD EBOOK →

In-Circuit Testing discusses what an in-circuit test (ICT) is and what it can and cannot do. It answers many questions on how tests are actually carried out, with the benefits and drawbacks of the techniques. The emphasis throughout is towards practical problem solving, and many of the examples used are of surface mount printed circuit boards (PCBs). The book contains separate chapters on application—fitting ICT into a typical test strategy and into the manufacturing environment. The buying decision is fully explored—choice of system, initial and ongoing costs, and preparation of the financial proposal to Management. Then, assuming the automatic test equipment (ATE) has been purchased, additional chapters are devoted to: programming problems and solutions, interfacing problems and solutions, fault diagnosis and fault finding tools. Design for in-circuit test also merits a chapter. This covers specific design guides and the constraints which need to be placed on designers to ensure that ICT is cost effective. The concluding chapter reviews the purchase and use of the chosen ICT with the benefit of hindsight; it covers cost effectiveness; looks at alternative methods of testing, programming, and interfacing; and alternative ways of costing the testing service. This book is written for potential purchasers and users of in-circuit automatic testers who are attracted to the concept of ICT, but who may need help. This includes Test Engineering Managers who need guidance on which equipment to buy for a given application (and how to financially justify the purchase), and ATE Programmers, Test Engineers and Technicians who would welcome practical advice on how best to use the chosen ATE.