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Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy

Author: Philip Moriarty

Publisher: Springer

Published: 2015-04-28

Total Pages: 169

ISBN-13: 3319174010

Imaging and Manipulation of Adsorbates using Dynamic Force Microscopy provides an overview of the latest developments in dynamic force microscopy (DFM) of atoms, molecules, and nanoparticles adsorbed on solid surfaces. Significant advances in the capabilities of this technique have been made in the last decade and this book represents a timely snapshot of the major research themes in the field, with a particular focus on the manipulation of matter at the atomic and (sub)molecular levels. This edited volume will be of keen interest to researchers active in nanoscience and its various sub-fields including, in particular, scanning probe microscopy. This book expands on the previous volumes in the series Advances in Atom and Single Molecule Machines. DFM is an exceptionally powerful tool for the imaging and probing of adsorbates on insulators and is now a component of the type of multiprobe interconnection systems described in Vol. 1 of the series. DFM can also be used to translate atoms and molecules in the context of the fabrication of the type of logic gates described in Vol. 2. When used in conjunction with STM, DFM also enables a detailed comparison of the chemical ‘architecture’ of a molecule with the spatial distribution of its orbital density, as described in Vol. 3. In this book readers will gain key insights into the current capabilities, and future potential, of dynamic force microscopy.

Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy

Author: Philip Moriarty

Publisher:

Published: 2015

Total Pages:

ISBN-13: 9783319174020

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Noncontact Atomic Force Microscopy

Author: Seizo Morita

Publisher: Springer

Published: 2015-05-18

Total Pages: 539

ISBN-13: 3319155881

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This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Noncontact Atomic Force Microscopy

Author: Seizo Morita

Publisher: Springer Science & Business Media

Published: 2009-09-18

Total Pages: 410

ISBN-13: 364201495X

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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Scanning Probe Microscopies Beyond Imaging

Author: Paolo Samorì

Publisher: John Wiley & Sons

Published: 2006-08-21

Total Pages: 570

ISBN-13: 3527608567

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This first book to focus on the use of SPMs to actively manipulate molecules and nanostructures on surfaces goes way beyond conventional treatments of scanning microscopy merely for imaging purposes. It reviews recent progress in the use of SPMs on such soft materials as polymers, with a particular emphasis on chemical discrimination, mechanical properties, tip-induced reactions and manipulations, as well as their nanoscale electrical properties. Detailing the practical application potential of this hot topic, this book is of great interest to specialists of wide-ranging disciplines, including physicists, chemists, materials scientists, spectroscopy experts, surface scientists, and engineers.

Molecular Manipulation with Atomic Force Microscopy

Author: Anne-Sophie Duwez

Publisher: CRC Press

Published: 2011-12-07

Total Pages: 291

ISBN-13: 1439809666

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With the invention of scanning probe techniques in the early 1980s, scientists can now play with single atoms, single molecules, and even single bonds. Force, dynamics, and function can now be probed at the single-molecule level. Molecular Manipulation with Atomic Force Microscopy (AFM) presents a series of topics that discuss concepts and methodologies used to manipulate and study single (bio)molecules with AFM. The first part is dedicated to the pulling of single molecules with force spectroscopy to investigate molecular interactions, mechanics, and mechanochemical processes, and the second part to the manipulation, repositioning, and targeted delivery of single molecules on substrates. Single molecule manipulation is an exciting area of research which made important breakthroughs in nanoscience and which could find potential applications in a diverse range of disciplines, including chemistry, biology, physics, material and polymer science, and engineering. New and experienced AFM researchers looking for applications beyond imaging will find a wealth of information in this informative volume.

Atomic Force Microscopy in Liquid

Author: Arturo M. Baró

Publisher: John Wiley & Sons

Published: 2012-05-14

Total Pages: 385

ISBN-13: 3527327584

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About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM

Atomic Force Microscopy

Author: Victor Bellitto

Publisher: BoD – Books on Demand

Published: 2012-03-23

Total Pages: 272

ISBN-13: 9535104144

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With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

Springer Handbook of Nanotechnology

Author: Bharat Bhushan

Publisher: Springer

Published: 2017-11-05

Total Pages: 1500

ISBN-13: 3662543575

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This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates a number of recent new developments. It integrates nanofabrication, nanomaterials, nanodevices, nanomechanics, nanotribology, materials science, and reliability engineering knowledge in just one volume. Furthermore, it discusses various nanostructures; micro/nanofabrication; micro/nanodevices and biomicro/nanodevices, as well as scanning probe microscopy; nanotribology and nanomechanics; molecularly thick films; industrial applications and nanodevice reliability; societal, environmental, health and safety issues; and nanotechnology education. In this new edition, written by an international team of over 140 distinguished experts and put together by an experienced editor with a comprehensive understanding of the field, almost all the chapters are either new or substantially revised and expanded, with new topics of interest added. It is an essential resource for anyone working in the rapidly evolving field of key technology, including mechanical and electrical engineers, materials scientists, physicists, and chemists.

Atomic Force Microscopy

Author: Greg Haugstad

Publisher: John Wiley & Sons

Published: 2012-09-04

Total Pages: 496

ISBN-13: 1118360680

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This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”