Electrothermal Analysis of VLSI Systems
Author: Yi-Kan Cheng
Publisher: Springer Science & Business Media
Published: 2005-12-01
Total Pages: 220
ISBN-13: 0306470241
DOWNLOAD EBOOK →This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.