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Electron Backscatter Diffraction in Materials Science

$Electron Backscatter Diffraction in Materials Science PDF$

Author: Adam J. Schwartz

Publisher: Springer Science & Business Media

Published: 2013-06-29

Total Pages: 352

ISBN-13: 1475732058

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Electron Backscatter Diffraction Materials Science

$Electron Backscatter Diffraction Materials Science PDF$

Author: Adam J. Schwartz

Publisher:

Published: 1968

Total Pages: 339

ISBN-13:

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Introduction to Texture Analysis

Author: Olaf Engler

Publisher: CRC Press

Published: 2009-11-16

Total Pages: 490

ISBN-13: 1420063669

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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, pra

Scanning Microscopy for Nanotechnology

Author: Weilie Zhou

Publisher: Springer Science & Business Media

Published: 2007-03-09

Total Pages: 533

ISBN-13: 0387396209

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Scanning Electron Microscopy and X-Ray Microanalysis

Author: Joseph Goldstein

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 679

ISBN-13: 1461332737

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This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

X-Ray Line Profile Analysis in Materials Science

Author: Gubicza, Jen?

Publisher: IGI Global

Published: 2014-03-31

Total Pages: 359

ISBN-13: 1466658533

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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Recrystallization and Related Annealing Phenomena

Author: F.J. Humphreys

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 520

ISBN-13: 008098388X

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The annealing of deformed materials is of both technological importance and scientific interest. The phenomena have been most widely studied in metals, although they occur in all crystalline materials such as the natural deformation of rocks and the processing of technical ceramics. Research is mainly driven by the requirements of industry, and where appropriate, the book discusses the extent to which we are able to formulate quantitative, physically-based models which can be applied to metal-forming processes. The subjects treated in this book are all active research areas, and form a major part of at least four regular international conference series. However, there have only been two monographs published in recent times on the subject of recrystallization, the latest nearly 20 years ago. Since that time, considerable advances have been made, both in our understanding of the subject and in the techniques available to the researcher. The book covers recovery, recrystallization and grain growth in depth including specific chapters on ordered materials, two-phase alloys, annealing textures and annealing during and after hot working. Also contained are treatments of the deformed state and the structure and mobility of grain boundaries, technologically important examples and a chapter on computer simulation and modelling. The book provides a scientific treatment of the subject for researchers or students in Materials Science, Metallurgy and related disciplines, who require a more detailed coverage than is found in textbooks on physical metallurgy, and a more coherent treatment than will be found in the many conference proceedings and review articles.

Compendium of Surface and Interface Analysis

Author: The Surface Science Society of Japan

Publisher: Springer

Published: 2018-02-19

Total Pages: 807

ISBN-13: 9811061564

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This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.

Transmission Electron Microscopy

Author: David B. Williams

Publisher: Springer Science & Business Media

Published: 2013-03-09

Total Pages: 708

ISBN-13: 1475725191

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Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Diffraction Analysis of the Microstructure of Materials

$Diffraction Analysis of the Microstructure of Materials PDF$

Author: Eric J. Mittemeijer

Publisher: Springer Science & Business Media

Published: 2013-11-21

Total Pages: 557

ISBN-13: 3662067234

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Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.