-PDF Download- Atomic Force Microscopy Based Nanorobotics EBOOK

Atomic Force Microscopy Based Nanorobotics

Author: Hui Xie

Publisher: Springer

Published: 2011-09-25

Total Pages: 350

ISBN-13: 3642203299

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

Introduction to Nanorobotic Manipulation and Assembly

Author: Ning Xi

Publisher: Artech House

Published: 2012

Total Pages: 311

ISBN-13: 1608071332

DOWNLOAD EBOOK →

Nanotechnology will allow us to build devices smaller than previously thought possible and will bring fundamental changes to disciplines within engineering, chemistry, medicine, biology, and physics. Understanding the principles of nano manipulation and assembly is tremendously important for those aiming to develop nanoscale systems. This forward-looking resource offers you cutting-edge coverage of the fundamentals and latest applications in this burgeoning field from an engineering perspective. The book shows you how nano-manipulation allows for the detection and manipulation of tiny entities such as single molecules, nanotubes, nanocubes, cells, viruses, proteins, and DNA molecules. You discover the most promising nanorobotic manipulation and assembly methods and find clear examples of key application areas, including nano sensors, electronics, and biomedical engineering. Supported with over 100 illustrations, this groundbreaking volumes offers comprehensive coverage of the subject, from the physics of nano manipulation... to robotic assembly of nano devices. Moreover, you get a glimpse of the future direction of this revolutionary technological area.

AFM-Based Observation and Robotic Nano-manipulation

Author: Shuai Yuan

Publisher: Springer Nature

Published: 2020-02-15

Total Pages: 189

ISBN-13: 981150508X

DOWNLOAD EBOOK →

This book highlights the latest advances in AFM nano-manipulation research in the field of nanotechnology. There are numerous uncertainties in the AFM nano-manipulation environment, such as thermal drift, tip broadening effect, tip positioning errors and manipulation instability. This book proposes a method for estimating tip morphology using a blind modeling algorithm, which is the basis of the analysis of the influence of thermal drift on AFM scanning images, and also explains how the scanning image of AFM is reconstructed with better accuracy. Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment. Lastly, it presents an AFM-based nano-manipulation platform to illustrate the effectiveness of the proposed method using theoretical research, such as tip positioning and virtual nano-hand.

Life at the Nanoscale

Author: Yves Dufrene

Publisher: CRC Press

Published: 2019-03-28

Total Pages: 460

ISBN-13: 981426797X

DOWNLOAD EBOOK →

Proceeding from basic fundamentals to applications, this volume provides a comprehensive overview of the use of AFM and related scanning probe microscopies for cell surface analysis. It covers all cell types, from viruses and protoplasts to bacteria and animal cells. It also discusses a range of advanced AFM modalities, including high-resolution imaging, nanoindentation measurements, recognition imaging, and single-molecule and single-cell force spectroscopy. The book covers methodologies for preparing and analyzing cells and membranes of all kinds and highlights recent examples to illustrate the power of AFM techniques in life sciences and nanomedicine.

Investigations of Cellular and Molecular Biophysical Properties by Atomic Force Microscopy Nanorobotics

Author: Mi Li

Publisher: Springer

Published: 2017-10-06

Total Pages: 135

ISBN-13: 9811068291

DOWNLOAD EBOOK →

This book presents methodological and application research in detecting cellular and molecular biophysical properties based on atomic force microscopy (AFM) nanorobotics. Series methods for in situ label-free visualizing and quantifying the multiple physical properties of single cells and single molecules were developed, including immobilization strategies for observing fine structures of living cells, measurements of single-cell mechanics, force recognition of molecular interactions, and mapping protein organizations on cell surface. The biomedical applications of these methods in clinical lymphoma treatments were explored in detail, including primary sample preparation, cancer cell recognition, AFM detection and data analysis. Future directions about the biomedical applications of AFM are also given.

Nanorobotics

Author: Constantinos Mavroidis

Publisher: Springer Science & Business Media

Published: 2013-01-04

Total Pages: 464

ISBN-13: 1461421195

DOWNLOAD EBOOK →

Nanorobots can be defined as intelligent systems with overall dimensions at or below the micrometer range that are made of assemblies of nanoscale components with individual dimensions ranging between 1 to 100 nm. These devices can now perform a wide variety of tasks at the nanoscale in a wide variety of fields including but not limited to fields such as manufacturing, medicine, supply chain, biology, and aerospace. Nanorobotics: Current Approaches and Techniques offers a comprehensive overview of this emerging interdisciplinary field with a wide ranging discussion that includes nano-manipulation and industrial nanorobotics, nanorobotic manipulation in biology and medicine, nanorobotic sensing, navigation and swarm behavior and CNT, and protein and DNA-based nanorobotics.

Noncontact Atomic Force Microscopy

Author: Seizo Morita

Publisher: Springer

Published: 2015-05-18

Total Pages: 527

ISBN-13: 3319155881

DOWNLOAD EBOOK →

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Atomic Force Microscopy

Author: Wesley C. Sanders

Publisher: CRC Press

Published: 2019-10-08

Total Pages: 144

ISBN-13: 1000707946

DOWNLOAD EBOOK →

This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.

Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit

Author: En-Te Hwu

Publisher: Edwin Hwu

Published: 2014-04-30

Total Pages: 136

ISBN-13:

DOWNLOAD EBOOK →

A novel non-contact multiaxial astigmatic detection system (ADS) is designed and developed using the astigmatism as the measuring principle for the translational displacement, the angle, and their variations of a measured surface simultaneously. An optical pickup unit (OPU) of a commercial digital versatile disk (DVD) read only memory (ROM) drive can be used directly as an optical path mechanism in the above mentioned ADS, which can measure the translational and angular displacements accurately and simultaneously. The total linear detection range and the maximum measurement bandwidth of the ADS are 6 mm and 80MHz, respectively. The resolution of the translational displacement measurement is in sub-angstrom scale. For an operating frequency of 700 kHz, the noise floors of the translational and angular signals are below 0.8 pm/Hz1/2 and 0.4 mrad/ Hz1/2, respectively. The ADS can monitor the translational and two orthogonal angular displacements of a micro fabricated cantilever in atomic force microscopy (AFM). All the three, contact non-contact and tapping, modes can resolve the single atomic steps of the graphite surface, which indicates that atomic resolution is achievable with the ADS. The thermal noise spectra of the AFM probe can be clearly measured as well. Furthermore, the accuracy of scanning probe microscopy (SPM) depends not only on the measurement system itself, but also by the accuracy of the signal processing, which further depends on the physical and geometrical characteristics of the probe. The structure of the ADS is compact and stable. Besides the measurements through AFM probes, the ADS can be operated in profilometer mode. The CD surface and the CCD microlens are measured by this mode. The maximum scanning speed can reach up to 3.84×106 mm/s theoretically, almost one million times faster than that of a commercial SPM system. The ADS has a great potential for future development, the expansibility and the accuracy can evolve with the performance of future OPU. From the DVD OPU to higher resolution one, such as the OPU of the Blu-ray drive or high- definition (HD-DVD), can be integrated into the ADS as well. KEYWORDS: Astigmatism, ADS, Translational displacement, Angular displacement, SPM, AFM, Cantilever, Optical profilometer

Electrical Atomic Force Microscopy for Nanoelectronics

Author: Umberto Celano

Publisher: Springer

Published: 2019-08-01

Total Pages: 408

ISBN-13: 3030156125

DOWNLOAD EBOOK →

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.