2016 IEEE 25th Asian Test Symposium

2016 IEEE 25th Asian Test Symposium PDF

Author:

Publisher:

Published: 2016

Total Pages: 320

ISBN-13:

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Annotation The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.

2023 IEEE 32nd Asian Test Symposium (ATS)

2023 IEEE 32nd Asian Test Symposium (ATS) PDF

Author: IEEE Staff

Publisher:

Published: 2023-10-14

Total Pages: 0

ISBN-13:

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The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind

2022 IEEE 31st Asian Test Symposium (ATS)

2022 IEEE 31st Asian Test Symposium (ATS) PDF

Author: IEEE Staff

Publisher:

Published: 2022-11-21

Total Pages: 0

ISBN-13: 9781665472289

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The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind

2020 IEEE 29th Asian Test Symposium (ATS)

2020 IEEE 29th Asian Test Symposium (ATS) PDF

Author: IEEE Staff

Publisher:

Published: 2020-11-23

Total Pages:

ISBN-13: 9781728174686

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Electronic test of devices, boards, and systems covering the complete test cycle from design verification,design for test, design for manufacturing, silicon debugging, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement

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