Applications Of X-ray Photoelectron Spectroscopy To Catalytic Studies: From Routine Analysis To Cutting-edge Surface Characterization

Applications Of X-ray Photoelectron Spectroscopy To Catalytic Studies: From Routine Analysis To Cutting-edge Surface Characterization PDF

Author: Spyridon Zafeiratos

Publisher: World Scientific

Published: 2023-07-04

Total Pages: 548

ISBN-13: 180061330X

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X-ray photoelectron spectroscopy (XPS) has become a standard practice technique, and automated XPS facilities can be found in industry and in universities all over the world. This transformed XPS from an advanced characterization method for dedicated research, to a rather standard analysis technique of surface analysis. The catalyst's surface state is probably the most prominent factor that influences the catalytic performance. It is therefore no surprise that XPS has become an indispensable tool in studies of solid catalysts. It has been directly used to investigate issues such as the surface composition of the active catalyst and reaction and deactivation mechanisms.The objective of this book is to provide a comprehensive overview of the current status and future perspectives of X-ray photoelectron spectroscopy dedicated to catalytic applications, including thermal catalysis, electrocatalysis, and photo(electro)catalysis. The book contains 13 chapters, starting with the necessary introduction of the technique background, including basic phenomena and instrumentation aspects. The second part of the book focuses on the presentation of long-established applications of the technique, such as XPS studies of model catalysts. Finally, the book describes relatively recent developments of this method for cutting-edge surface characterization mainly using synchrotron X-ray radiation.

Mechanisms In Heterogeneous Catalysis

Mechanisms In Heterogeneous Catalysis PDF

Author: Rutger A Van Santen

Publisher: World Scientific

Published: 2023-06-28

Total Pages: 719

ISBN-13: 1800614020

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Heterogeneous catalysis has developed over the past two centuries as a technology driven by the needs of society, and is part of Nobel Prize-winning science. This book describes the spectacular increase in molecular understanding of heterogenous catalytic reactions in important industrial processes. Reaction mechanism and kinetics are discussed with a unique focus on their relation with the inorganic chemistry of the catalyst material. An introductory chapter presents the development of catalysis science and catalyst discovery from a historical perspective. Five chapters that form the thrust of the book are organized by type of reaction, reactivity principles, and mechanistic theories, which provide the scientific basis to structure-function relationships of catalyst performance. Present-day challenges to catalysis are sketched in a final chapter. Written by one of the world's leading experts on the topic, this definitive text is an essential reference for students, researchers and engineers working in this multibillion-dollar field.

Application of Ambient Pressure X-ray Photoelectron Spectroscopy to Catalysis

Application of Ambient Pressure X-ray Photoelectron Spectroscopy to Catalysis PDF

Author: Franklin Tao

Publisher: John Wiley & Sons

Published: 2024-02-05

Total Pages: 294

ISBN-13: 1119845440

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APPLICATION OF AMBIENT PRESSURE X-RAY PHOTOELECTRON SPECTROSCOPY Authoritative and detailed reference on ambient-pressure x-ray photoelectron spectroscopy for practitioners and researchers starting in the field Application of Ambient Pressure X-ray Photoelectron Spectroscopy to Catalysis introduces a relatively new analytical method and its applications to chemistry, energy, environmental, and materials sciences, particularly the field of heterogeneous catalysis, covering its background and historical development, its principles, the instrumentation required to use it, analysis of data collected with it, and the challenges it faces. The features of this method are described early in the text; the starting chapters provide a base for understanding how AP-XPS tracks crucial information in terms of the surface of a catalyst during catalysis. The second half of this book delves into the specific applications of AP-XPS to fundamental studies of different catalytic reactions. In later chapters, the focus is on how AP-XPS could provide key information toward understanding catalytic mechanisms. To aid in reader comprehension, the takeaways of each chapter are underlined. In Application of Ambient Pressure X-ray Photoelectron Spectroscopy to Catalysis, readers can expect to find detailed information on specific topics such as: Going from surface of model catalyst in UHV to surface of nanoparticle catalyst during catalysis Application of XPS from surface in UHV to surface in gas or liquid phase and fundamentals of X-ray spectroscopy Significance and challenges of studying surface of a catalyst in gaseous phase and instrumentation of ambient pressure X-ray photoelectron spectrometers Experimental methods of AP-XPS studies and difference in data analysis between AP-XPS and high vacuum XPS Ambient Pressure X-Ray Photoelectron Spectroscopy is an ideal resource for entry level researchers and students involved in x-ray photoelectron spectroscopy. Additionally, the text will appeal to scientists in more senior roles in academic and government laboratory institutions in the fields of chemistry, chemical engineering, energy science, and materials science.

X-ray Absorption Fine Structure for Catalysts and Surfaces

X-ray Absorption Fine Structure for Catalysts and Surfaces PDF

Author: Yasuhiro Iwasawa

Publisher: World Scientific

Published: 1996

Total Pages: 438

ISBN-13: 9789810223236

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X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be applied in a static or a dynamic state (in-situ condition). The XAFS can provide information that is not accessible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide a molecular-level approach to the study of reaction mechanisms for the understanding of catalysts and development of new catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The applications of XAFS have now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book caters to a wide range of researchers and students working in the domain or related topics.

X-Ray Photoelectron Spectroscopy of Solid Surfaces

X-Ray Photoelectron Spectroscopy of Solid Surfaces PDF

Author: V.I. Nefedov

Publisher: CRC Press

Published: 2023-01-06

Total Pages: 200

ISBN-13: 1466564733

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This volume outlines the physical and methodical concepts of X-ray photoelectron spectroscopy (XPS) specifically for surface studies using both inner and valence electron levels. It discusses the theory and practice of XPS qualitative and quantitative analysis of solid state surfaces and provides lists of extended experimental and theoretical data necessary for the determination of concentration and thin film thicknesses. In addition it covers the many problems concerning in-depth profiling, ion sputtering rate and damages of the structure of altered layers, as well as applications of angular dependence of the intensities and photoelectron diffraction for surface studies. Also provided are the applications of XPS for the investigations of catalysts, adsorption, electronic surface states, oxydation of semi-conductors and alloys, minerals, including lunar regolith and natural gold, glasses, radiation damage, surface diffusion, polymers, etc.

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science PDF

Author: Siegfried Hofmann

Publisher: Springer Science & Business Media

Published: 2012-10-25

Total Pages: 545

ISBN-13: 3642273815

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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Modern ESCAThe Principles and Practice of X-Ray Photoelectron Spectroscopy

Modern ESCAThe Principles and Practice of X-Ray Photoelectron Spectroscopy PDF

Author: Tery L. Barr

Publisher: CRC Press

Published: 2020-11-25

Total Pages: 373

ISBN-13: 1000099385

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Modern ESCA: The Principles and Practice of X-Ray Photoelectron Spectroscopy is a unique text/reference that focuses on the branch of electron spectroscopy generally labeled as either Electron Spectroscopy for Chemical Analysis (ESCA) or X-ray Photoelectron Spectroscopy (XPS). The book emphasizes the use of core level and valence band binding energies, their shifts, and line widths. It describes the background, present status, and possible future uses of a number of recently developed branches of ESCA, including:

X-Ray Photoelectron Spectroscopy of Solid Surfaces

X-Ray Photoelectron Spectroscopy of Solid Surfaces PDF

Author: V.I. Nefedov

Publisher:

Published: 2023

Total Pages: 0

ISBN-13: 9780429070587

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This volume outlines the physical and methodical concepts of X-ray photoelectron spectroscopy (XPS) specifically for surface studies using both inner and valence electron levels. It discusses the theory and practice of XPS qualitative and quantitative analysis of solid state surfaces and provides lists of extended experimental and theoretical data necessary for the determination of concentration and thin film thicknesses. In addition it covers the many problems concerning in-depth profiling, ion sputtering rate and damages of the structure of altered layers, as well as applications of angular dependence of the intensities and photoelectron diffraction for surface studies. Also provided are the applications of XPS for the investigations of catalysts, adsorption, electronic surface states, oxydation of semi-conductors and alloys, minerals, including lunar regolith and natural gold, glasses, radiation damage, surface diffusion, polymers, etc.

X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry

X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry PDF

Author: WE. Baitinger

Publisher:

Published: 1978

Total Pages: 17

ISBN-13:

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The combination of X-ray photoelectron spectroscopy (XPS) with secondary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, we have tested our ultrahigh vacuum XPS/SIMS system to characterize a variety of metal, alloy, and metal oxygen surfaces. We report on the examination of clean silver surfaces where ions of clusters up to Agn+ where n = 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen. In general, we have tried to illustrate the advantages of this combined technique.

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