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An Introduction to Scanning Acoustic Microscopy

Author: Andrew Briggs

Publisher: Oxford University Press, USA

Published: 1985

Total Pages: 88

ISBN-13:

This up-to-date handbook provides a lucid introduction to acoustic microscopes with submicron resolution. The first half of the handbook shows how to operate the instrument, offering a description of a typical acoustic microscope, some detailed guidance for use, and a helpful discussion of the elements of contrast theory. The second half examines samples of the images that can be obtained, including micrographs of composites, grain structure, layered devices, and fine microcracks. The author has designed the book to help both those who have recently purchased an acoustic microscope and those who merely wish to find out if an acoustic microscope can help their research, whether it be in materials science, metallurgy, surface physics, or surface chemistry.

An introduction to scanning acoustic microscopy

Author:

Publisher:

Published: 1985

Total Pages: 0

ISBN-13:

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Acoustic Microscopy

Author: Roman Gr. Maev

Publisher: John Wiley & Sons

Published: 2008-09-08

Total Pages: 291

ISBN-13: 3527623140

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This only and up-to-date monograph on this versatile method covers its use in a range of applications spanning the fields of physics, materials science, electrical engineering, medicine, and research and industry. Following an introduction, the highly experienced author goes on to investigate acoustic field structure, output signal formation in transmission raster acoustic microscopes and non-linear acoustic effects. Further chapters deal with the visco-elastic properties and microstructure of the model systems and composites used, as well as polymer composite materials and the microstructure and physical-mechanical properties of biological tissues. A handy reference for materials scientists, electrical engineers, radiologists, laboratory medics, test engineers, physicists, and graduate students.

Acoustic Scanning Probe Microscopy

Author: Francesco Marinello

Publisher: Springer Science & Business Media

Published: 2012-10-04

Total Pages: 513

ISBN-13: 3642274943

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The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Acoustic Microscopy

Author: Andrew Briggs

Publisher: Oxford University Press

Published: 2010

Total Pages: 383

ISBN-13: 0199232733

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For many years Acoustic Microscopy has been the definitive book on the subject. A key development since it was first published has been the development of ultrasonic force microscopy. The 2nd edition has a major new chapter on this technique and its applications.

Advances in Acoustic Microscopy

Author: Andrew Briggs

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 292

ISBN-13: 1461558514

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This is the second volume of Advances in Acoustic Microscopy. It continues the aim of presenting applications and developments of techniques that are related to high-resolution acoustic imaging. We are very grateful to the authors who have devoted considerable time to preparing these chapters, each of which describes a field of growing importance. Laboratories that have high-performance acoustic microscopes are frequently asked to examine samples for which the highest available resolution is not necessary, and the ability to penetrate opaque layers is more significant. Such applications can be thought of as bridging the gap be tween acoustic microscopy at low gigahertz frequencies, and on the one hand nondestructive testing of materials at low megahertz frequencies and on the other hand medical ultrasonic imaging at low megahertz frequencies. Commercial acoustic microscopes are becoming increasingly available and popular for such applications. We are therefore delighted to be able to begin the volume with chapters from each of those two fields. The first chapter, by Gabriele Pfannschmidt, describes uses of acoustic microscopy in the semiconductor industry. It provides a splendid balance to the opening chapter of Volume 1, which came from a national research center, being written from within a major European electronics industry itself. Dr Pfann schmidt describes the use of two quite different types of acoustic microscopes, and points out the advantages of each for specific purposes.

An Introduction to Scanning Acoustic Microscopy

Author: Andrew Briggs

Publisher: Oxford University Press, USA

Published: 1985

Total Pages: 88

ISBN-13:

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Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Author: Gerhard Huebschen

Publisher: Woodhead Publishing

Published: 2016-03-23

Total Pages: 322

ISBN-13: 008100057X

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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials

Microelectronics Fialure Analysis Desk Reference, Seventh Edition

Author: Tejinder Gandhi

Publisher: ASM International

Published: 2019-11-01

Total Pages: 750

ISBN-13: 1627082468

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The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.

Advances in Acoustic Microscopy

Author: Andrew Briggs

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 374

ISBN-13: 1461518733

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In 1992 Acoustic Microscopy was published by Oxford University Press, in the series of Monographs on the Physics and Chemistry of Materials. Reviews appeared in the Journal of Microscopy [169 (1), 91] and in Contemporary Physics [33 (4), 296]. At the time of going to press, it seemed that the field of acoustic microscopy had settled down from the wonderful developments in resolution that had been seen in the late seventies and the early eighties and from the no less exciting developments in quantitative elastic measurements that had followed. One reviewer wrote, "The time is ripe for such a book, now that the expansion of the subject has perceptively slowed after it was detonated by Lemons and Quate. " [A. Howie, Proc. RMS 27 (4), 280]. In many ways, this remains true. The basic design for both imaging and quantitative instruments is well-established; the upper frequency for routine imaging is the 2 GHz established by the Ernst Leitz scanning acoustic microscope (ELSAM) in 1984. For the most accurate V(z) measurements, the 225-MHz line-focus-beam lens, developed at Tohoku Univer sity a little before then, remains standard. The principles of the contrast theory have been confirmed by abundant experience; in particular the role of surface acoustic waves, such as Rayleigh waves, dominates the contrast in most high resolution studies of many materials.