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Advances in Speckle Metrology and Related Techniques

Author: Guillermo H. Kaufmann

Publisher: John Wiley & Sons

Published: 2011-01-25

Total Pages: 322

ISBN-13: 3527633871

Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.

Speckle Metrology

Author: R Erf

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 346

ISBN-13: 0323154972

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Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications. The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system geometries, data reduction procedures, and specific applications. These applications are discussed in detail in individual chapters, such as structures inspection. Adaptation of speckle measurement techniques in video recording and processing technology is also given emphasis in one chapter. Finally, one chapter is dedicated to a discussion on the speckle interferometer as one of the most used instrument in metrological speckle application. This text is a valuable reference to students in the fields of engineering and applied science.

Engineering Applications of Residual Stress, Volume 8

Author: Tom Proulx

Publisher: Springer Science & Business Media

Published: 2011-06-10

Total Pages: 142

ISBN-13: 1461402255

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Engineering Applications of Residual Stress represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials, MEMS and Nanotechnology; Optical Measurements, Modeling and, Metrology; Experimental and Applied Mechanics, and Thermomechanics and Infra-Red Imaging.

Speckle Metrology

Author: R.S. Sirohi

Publisher: CRC Press

Published: 2020-08-18

Total Pages: 572

ISBN-13: 1000104958

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This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

Digital Speckle Pattern Interferometry and Related Techniques

Author: Pramod K. Rastogi

Publisher: John Wiley & Sons

Published: 2001-02-08

Total Pages: 392

ISBN-13:

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Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry.

Optical Imaging and Metrology

Author: Wolfgang Osten

Publisher: John Wiley & Sons

Published: 2012-09-10

Total Pages: 471

ISBN-13: 3527648461

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A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.

Fringe Pattern Analysis for Optical Metrology

Author: Manuel Servin

Publisher: John Wiley & Sons

Published: 2014-05-30

Total Pages: 344

ISBN-13: 3527681108

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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Handbook of Laser Technology and Applications: Applications

Author: Colin E. Webb

Publisher: CRC Press

Published: 2004

Total Pages: 1218

ISBN-13: 9780750309660

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Handbook of Laser Technology and Applications (Three- Volume Set)

Author: Colin Webb

Publisher: CRC Press

Published: 2003-12-01

Total Pages: 2779

ISBN-13: 1420050532

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The invention of the laser was one of the towering achievements of the twentieth century. At the opening of the twenty-first century we are witnessing the burgeoning of the myriad technical innovations to which that invention has led. The Handbook of Laser Technology and Applications is a practical and long-lasting reference source for scientists a

Linear Canonical Transforms

Author: John J. Healy

Publisher: Springer

Published: 2015-11-26

Total Pages: 463

ISBN-13: 1493930281

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This book provides a clear and accessible introduction to the essential mathematical foundations of linear canonical transforms from a signals and systems perspective. Substantial attention is devoted to how these transforms relate to optical systems and wave propagation. There is extensive coverage of sampling theory and fast algorithms for numerically approximating the family of transforms. Chapters on topics ranging from digital holography to speckle metrology provide a window on the wide range of applications. This volume will serve as a reference for researchers in the fields of image and signal processing, wave propagation, optical information processing and holography, optical system design and modeling, and quantum optics. It will be of use to graduate students in physics and engineering, as well as for scientists in other areas seeking to learn more about this important yet relatively unfamiliar class of integral transformations.