A Review: Ultrahigh-Vacuum Technology for Electron Microscopes

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes PDF

Author: Nagamitsu Yoshimura

Publisher: Academic Press

Published: 2020-02-15

Total Pages: 575

ISBN-13: 012819703X

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A Review: Ultrahigh-Vacuum Technology for Electron Microscopes provides information on the fundamentals of ultra-high vacuum systems. It covers the very subtle process that can help increase pressure inside the microscope (or inside any other ultra-high vacuum system) and the different behavior of the molecules contributing to this kind of process. Prof Yoshimura’s book offers detailed information on electron microscope components, as well as UHV technology. This book is an ideal resource for industrial microscopists, engineers and scientists responsible for the design, operation and maintenance of electron microscopes. In addition, engineering students or engineers working with electron microscopes will find it useful. Teaches how to incorporate diffusion pumps for UHV electron microscopy Presents the work of an author who brings a lifetime of experience working on vacuum technology and electron microscopes

Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes

Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes PDF

Author: Nagamitsu Yoshimura

Publisher: Springer Science & Business Media

Published: 2013-09-12

Total Pages: 133

ISBN-13: 4431544488

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This book describes the developmental history of the vacuum system of the transmission electron microscope (TEM) at the Japan Electron Optics Laboratory (JEOL) from its inception to its use in today’s high-technology microscopes. The author and his colleagues were engaged in developing vacuum technology for electron microscopes (JEM series) at JEOL for many years. This volume presents a summary and explanation of their work and the technology that makes possible a clean ultrahigh vacuum. The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users’ reports of problems in the vacuum system of the JEM, such as the occurrence of a micro-discharge and the back-streaming of the diffusion pump (DP) oil vapor. This work is a valuable resource for researchers who use the transmission electron microscope and for engineers and scientists interested in its technology.

Foundations of Molecular-Flow Networks for Vacuum System Analysis

Foundations of Molecular-Flow Networks for Vacuum System Analysis PDF

Author: Nagamitsu Yoshimura

Publisher: Academic Press

Published: 2019-11-13

Total Pages: 208

ISBN-13: 0128186887

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Foundations of Molecular-Flow Networks for Vacuum System Analysis is the only book that covers desorption, adsorption and outgassing in relation to molecular-flow networks. It will be beneficial for academics, students and industry personnel working in the field of ultra-high vacuums for designing the equipment/set-up and as a guide to understand the processes relating to vacuums. The book is fully supported with equations and case studies from industry. Vacuum technology is extensively used in large synchrotrons and other large accelerators, as well as in many other smaller industrial and scientific facilities. Hence, this book is a welcome addition to the literature. Explains how to design, model and simulate vacuum systems to obtain satisfactory pressure distributions Offers a practical description of molecular flow, providing techniques to design molecular flow networks of vacuum systems and processes Explores equivalence with electrical components to help readers with simulation using free software such as LTSPICE

Vacuum Technology

Vacuum Technology PDF

Author: Nagamitsu Yoshimura

Publisher: Springer Science & Business Media

Published: 2007-12-04

Total Pages: 359

ISBN-13: 3540744339

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In this book, Yoshimura provides a review of the UHV related development during the last decades. His very broad experience in the design enables him to present us this detailed reference. After a general description how to design UHV systems, he covers all important issue in detail, like pumps, outgasing, Gauges, and Electrodes for high voltages. Thus, this book serves as reference for everybody using UVH in scientific equipment.

Vacuum Methods in Electron Microscopy

Vacuum Methods in Electron Microscopy PDF

Author: Wilbur C. Bigelow

Publisher: Ashgate Publishing

Published: 1994

Total Pages: 520

ISBN-13: 9781855780538

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This study provides full details and advice on the understanding and practical operation of the vacuum systems found in electron microscope laboratories. The importance of the correct functioning of these systems is too frequently underestimated, with the result that electron microscopes and other vacuum equipment, such as freeze-etching units and sputter coaters, give less than their optimum performance.

Auger Electron Spectroscopy

Auger Electron Spectroscopy PDF

Author: Donald T. Hawkins

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 305

ISBN-13: 1468413872

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Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.

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