Author: Richard L. Sydnor
Publisher:
Published: 1993
Total Pages: 508
ISBN-13:
DOWNLOAD EBOOK →Papers covered: recent developments in rubidium, cesium, and hydrogen-based frequency standards, and in cryogenic and trapped-ion technology; international and transnational applications of PTTI technology with emphasis on satellite laser tracking networks, GLONASS timing, intercomparison of national time scales, and international telecommunications; applications of PTTI technology to the telecommunications, power distribution, and platform positioning, and geophysical survey industries; applications of PTTI technology to evolving military communications and navigation systems; and dissemination of precise time and frequency by means of GPS, GLONASS, MILSTAR, Loran, and synchronous communications satellites.
Author:
Publisher:
Published: 1994
Total Pages: 880
ISBN-13:
DOWNLOAD EBOOK →Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: Dinesh K. Aswal
Publisher: Springer Nature
Published: 2023-08-23
Total Pages: 2504
ISBN-13: 9819920744
DOWNLOAD EBOOK →This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.