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Author: IEEE Staff
Publisher:
Published: 2022-11-21
Total Pages: 0
ISBN-13: 9781665472289
DOWNLOAD EBOOK →The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind
Author: IEEE Staff
Publisher:
Published: 2023-10-14
Total Pages: 0
ISBN-13:
DOWNLOAD EBOOK →The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind
Author:
Publisher: IEEE
Published: 2002-12-01
Total Pages: 450
ISBN-13: 9780769518268
DOWNLOAD EBOOK →Author: IEEE Staff
Publisher:
Published: 2017-11-27
Total Pages:
ISBN-13: 9781538635162
DOWNLOAD EBOOK →The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind
Author: IEEE Staff
Publisher:
Published: 2019
Total Pages: 0
ISBN-13: 9781728126951
DOWNLOAD EBOOK →Author: IEEE Staff
Publisher:
Published: 2020-11-23
Total Pages:
ISBN-13: 9781728174686
DOWNLOAD EBOOK →Electronic test of devices, boards, and systems covering the complete test cycle from design verification,design for test, design for manufacturing, silicon debugging, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement
Author: IEEE Staff
Publisher:
Published: 2018-10-15
Total Pages:
ISBN-13: 9781538694671
DOWNLOAD EBOOK →The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind
Author: IEEE Staff
Publisher:
Published: 2021-11-22
Total Pages:
ISBN-13: 9781665440523
DOWNLOAD EBOOK →With the test technology facing its grand challenges to ensure the quality of ICs and electronic systems incorporating more and more sophisticated manufacturing processes and system integration technologies in various emerging applications such as Internet of Things, cloud computing, automotive electronics, etc , global proliferation and cooperation is increasingly more important
