2021 IEEE 30th Asian Test Symposium (ATS)

2021 IEEE 30th Asian Test Symposium (ATS) PDF

Author: IEEE Staff

Publisher:

Published: 2021-11-22

Total Pages:

ISBN-13: 9781665440523

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With the test technology facing its grand challenges to ensure the quality of ICs and electronic systems incorporating more and more sophisticated manufacturing processes and system integration technologies in various emerging applications such as Internet of Things, cloud computing, automotive electronics, etc , global proliferation and cooperation is increasingly more important

2023 IEEE 32nd Asian Test Symposium (ATS)

2023 IEEE 32nd Asian Test Symposium (ATS) PDF

Author: IEEE Staff

Publisher:

Published: 2023-10-14

Total Pages: 0

ISBN-13:

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The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind

2017 IEEE 26th Asian Test Symposium (ATS)

2017 IEEE 26th Asian Test Symposium (ATS) PDF

Author: IEEE Staff

Publisher:

Published: 2017-11-27

Total Pages:

ISBN-13: 9781538635162

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The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind

2022 IEEE 31st Asian Test Symposium (ATS)

2022 IEEE 31st Asian Test Symposium (ATS) PDF

Author: IEEE Staff

Publisher:

Published: 2022-11-21

Total Pages: 0

ISBN-13: 9781665472289

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The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind

2020 IEEE 29th Asian Test Symposium (ATS)

2020 IEEE 29th Asian Test Symposium (ATS) PDF

Author: IEEE Staff

Publisher:

Published: 2020-11-23

Total Pages:

ISBN-13: 9781728174686

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Electronic test of devices, boards, and systems covering the complete test cycle from design verification,design for test, design for manufacturing, silicon debugging, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement

Advances in the Boolean Domain

Advances in the Boolean Domain PDF

Author: Bernd Steinbach

Publisher: Cambridge Scholars Publishing

Published: 2022-09-26

Total Pages: 254

ISBN-13: 1527588734

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This book gathers together the results of research on the Boolean domain related to important real-life applications that will support the reader in solving their scientific and practical tasks. It highlights that ongoing digitalization leads to increasing amounts of complex applications, the digits of which are usually encoded by Boolean variables due to their simplicity as only two values are used. However, as shown here, an exponentially growing number of vectors of Boolean variables can negate this simplicity, which leads to challenges in advancing progress in the Boolean domain and supporting a wide range of applications.

Intelligent Beam Control in Accelerators

Intelligent Beam Control in Accelerators PDF

Author: Zheqiao Geng

Publisher: Springer Nature

Published: 2023-05-11

Total Pages: 164

ISBN-13: 3031285972

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This book systematically discusses the algorithms and principles for achieving stable and optimal beam (or products of the beam) parameters in particle accelerators. A four-layer beam control strategy is introduced to structure the subsystems related to beam controls, such as beam device control, beam feedback, and beam optimization. This book focuses on the global control and optimization layers. As a basis of global control, the beam feedback system regulates the beam parameters against disturbances and stabilizes them around the setpoints. The global optimization algorithms, such as the robust conjugate direction search algorithm, genetic algorithm, and particle swarm optimization algorithm, are at the top layer, determining the feedback setpoints for optimal beam qualities. In addition, the authors also introduce the applications of machine learning for beam controls. Selected machine learning algorithms, such as supervised learning based on artificial neural networks and Gaussian processes, and reinforcement learning, are discussed. They are applied to configure feedback loops, accelerate global optimizations, and directly synthesize optimal controllers. Authors also demonstrate the effectiveness of these algorithms using either simulation or tests at the SwissFEL. With this book, the readers gain systematic knowledge of intelligent beam controls and learn the layered architecture guiding the design of practical beam control systems.